• Twitter
  • Youtube
  • Linkedin
  • CUSTOMER LOGIN
LTX-Credence
  • About
    • About Xcerra
    • Company Overview
    • Corporate Culture
    • Fast Facts
    • Management
    • Quality & Standards
  • Markets & Solutions
    • ASSP / ASIC Testing
    • Microcontroller Testing
      • Solutions for Microcontroller Testing
    • Power & Analog Testing
      • Solutions for Power Management Devices
    • RF PA/FEM Testing
    • Solutions for IoT and Sensor Testing
  • Products
    • Application Services
    • Diamondx Test System
      • Diamondx Instruments
      • DxV
    • PAx-ac RF PA/FEM System
      • PAx-ac Instruments
    • Other Test Systems
      • ASL Platform
        • ASL 1000
        • ASL Instruments
        • ASLx
      • Diamond Platform
        • Diamond Instruments
      • X-Series Platform
        • X-Series Configurations
        • X-Series Instruments
      • Integrated Multi-System
        • IMA @ Diamond
      • Nighthawk
  • News & Events
    • News
    • Events 2018
  • Careers
    • Careers at Xcerra
  • Contact & Support
    • Contact – Asia
    • Contact – Armenia, India, Israel
    • Contact – Europe
    • Contact – North America
    • Contact us
    • Support
      • Legacy Systems
      • System Problem Reporting
      • Training Center
    • Xpedite Help Center
  • Resources
    • Knowledge Center
    • LTXC Literature
    • Training Center
      • Course Catalog
      • Custom & On-Site
        • Request Form
      • Manage My Training
      • Schedule & Registration
      • Training Locations
      • Training Partners
  • Xcerra
  • Search
  • Menu

ASSP/ASIC Testing

microcontroller testingPlease click on the image to enlarge it

Typical End Markets and Applications

Automotive

  • Engine/transmission monitor/control
  • Safety
  • Infotainment

Communications (wired and wireless)

  • Cellular terminal, mobile connectivity (LAN, PAN, GPS, FM, TV)
  • SOHO broadband; CM, DSL, homeplug, WLAN

Consumer

  • Digital media (DTV, STB, DVD, Apps, Processors)

Computer

  • Hard disk drive and optical disk drive Controllers
  • Printer devices

Display Logic

  • T-CON, LCD Controller

Industrial

  • Control systems

Medical

  • Pacemakers

Diverse Test Requirements

  • High performance digital
  • Precision RF
  • Embedded memory
  • High power
  • And combination of all of the above.
  • Very high volume
  • Low volume/high mix

LTXC Solutions – for the Various Levels of Complexity

  • Diamond platform – recommended for non-RF SOC devices Read more
  • X-Series – recommended for precision analog and/or RF Read more

Handsets, especially multifunction smartphones that enable users to surf the web, enable social media communication technologies, play music and take photographs are a significant driver of Application Specific Standard Product (ASSP) and Application Specific Integrated Circuit (ASIC) devices. ASSP/ASIC devices, however, can be found in an extremely broad range of end products, from automobiles to medical devices.

The ASSP and ASIC market segments represent the single largest market for semiconductor test equipment . An ASSP is a semiconductor device that is dedicated for a specific application and sold to more than one user. An ASIC, similarly has a specific application but is designed and built for a specific company.

ASSP/ASIC devices cover a very broad range of end applications and in many different markets and can include a wide range of communication, processing and display technology. They can be pure analog devices, pure digital devices and everything in between, including RF.

The diversity of end applications is directly translated to the test requirements, as some devices may require high performance digital, some may require precision RF, some may require embedded memory, some may require high power, and some a combination of all of the above. Some of the devices may run in very high volume and other devices could be considered low volume/high mix.

The test solution decision is likely to take into account several issues: the need for multi-site test capability, the level of performance of the various instruments in the tester, and, of course, the cost. Semiconductor companies above all are constantly seeking ways to reduce the cost of test. This is as important for ASSP/ASIC devices as it is for any other semiconductor device.

At LTX-Credence we offer several products for testing ASSP/ASIC products so that we can match our innovative technology to your production needs ensuring we provide you with a solution that delivers the overall lowest cost of test.

 

  • ASSP / ASIC Testing
  • Data Converter Testing
  • Microcontroller Testing
    • Solutions for Microcontroller Testing
  • Power & Analog Testing
    • Solutions for Power Management Devices
  • RF PA/FEM Testing
  • Solutions for IoT and Sensor Testing
© LTX-Credence 2018
  • Twitter
  • Youtube
  • Linkedin
  • SW License
  • T&C of Sale
  • Vendor T&C
  • Terms of Use
  • Copyright & Trademarks
  • Privacy
  • Contact & Support
  • Staff
Scroll to top