Diamondx Test System
The next generation test platform for ASSP and MCUs
- Low cost of operations
- High throughput
- Proven test capabilities
- Universal slot architecture
The Diamondx test platform extends LTX-Credence’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, consumer ASSP and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends LTXC’s leadership in lowering the cost of operations. Proven test capability from the widely accepted Diamond10 and X-Series test platforms bring high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes and RF test to the Diamondx test system, making it suitable for testing today’s 3G/4G baseband, applications processors and integrated RF Transceivers & RF-SOC ASSP and SiP.
Additionally, the Diamondx will continue to be the low cost test provider for testing consumer ASSP; BlueRay DVD player/recorder, High Definition DTV and STB demodulators and decoders, baseband and applications processor devices, PC peripherals ASSP, RF Connectivity ICs as well as 8/16/32-bit microcontrollers, with an architecture to also support increasing test process complexity, like adaptive test, unit level traceability and concurrent test.
Diamondx is a universal slot architecture that allows for 20-slot, 40-slot and 60-slot configurations which can be upgraded on the production floor, using LTX-Credence IMA (Integrated Multi-System Architecture) technology. In addition, Diamondx can accommodate over 10,000 pins and can be configured with a variety of instruments.