Configurations for optimal testing of DSP, power, automotive, mixed signal, & RF applications
The X-Series is a comprehensive semiconductor test platform, with industry leading mixed signal and digital instrumentation and configurations that range from 20 to 80 instrument slots. The X-Series test platform offers a range of configurations designed to provide low-cost testing of a broad range of devices used in mobile, power, automotive, industrial and instrumentation markets. The X-Series has been designed to meet the challenges of testing a broad range of advanced mixed signal device technologies used in these markets. It offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.
The X-Series is offered in four different configurations, all based off the same instrumentation, software, system architecture and DUT interface.
The major difference between the various configurations is the slots available for instrumentation. The following summarizes the differences between the X-Series configurations:
- LX 20 slot
- MX 40 slot system
- EX 80 slot system
- PAx / PAx-ac; specialized configuration for RF PA and FEM testing
The X-Series allows selecting the ideal configuration for your specific requirements, providing a flexible solution with the right test performance and the right cost of test for each device in your portfolio. Each configuration offers a comprehensive portfolio of DSP, DC and power instruments.